Index: vhUnitTest/APPS/VKP/Klantspecifiek/Haefele/KortingParser/Parse/Test.cls.xml
===================================================================
diff -u -r61294 -r61295
--- vhUnitTest/APPS/VKP/Klantspecifiek/Haefele/KortingParser/Parse/Test.cls.xml	(.../Test.cls.xml)	(revision 61294)
+++ vhUnitTest/APPS/VKP/Klantspecifiek/Haefele/KortingParser/Parse/Test.cls.xml	(.../Test.cls.xml)	(revision 61295)
@@ -4,7 +4,7 @@
 <Super>vhUnitTest.TestCase</Super>
 
 <Method name="Test HaefeleDE">
-<Implementation><![CDATA[	#dim Customer As APPS.VKP.Korting.Customer = ##class(vhTest.Utils.APPS.VKP.Korting.Customer).GeefConsumerDE()
+<Implementation><![CDATA[	#dim Customer As APPS.VKP.Korting.Customer = ##class(vhTest.Utils.APPS.VKP.Korting.Customer).GeefCustomerDE()
 ]]></Implementation>
 </Method>
 </Class>